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Metrology |
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Process Equipment |
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| AFM/ SPM |
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High resolution Atomic Force
Microscopes and Scanning Probe
Microscopes for research and industry. |
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| Deposition |
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| Auto AFM/AFP |
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High-throughput Atomic Force
Microscopes and Atomic Force Profilers for semiconductor applications. |
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Etch |
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Ion beam etch for precise control
of etch depth and excellent
surface properties. |
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Optical | Stylus |
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High-speed optical profilers, interferometers, and stylus profilers
for production and research. |
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| Ion Sources |
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| The widest range of ion sources and controllers for a broad range of coating and etch applications. |
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| MOCVD |
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| Metal Organic Chemical Vapor Deposition |
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| Lapping |
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Lapping Systems for next generation lapping requirements for GMR, TMR andPMR heads.
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| Dicing |
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Dicing systemn deliver enabling technology for hard drive reliability.
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