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Veeco European Newsletter
Seeing at the Nanoscale IV
FIND PRODUCTS BY TECHNOLOGY
Metrology Process Equipment
AFM/ SPMS/ NSOM
High resolution Atomic Force
Microscopes and Scanning Probe
Microscopes for research and industry.
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Deposition
ALD IBD PVD
DLC Oxidation Cylindrical
Auto AFM/AFP
High-throughput Atomic Force
Microscopes and Atomic Force Profilers for semiconductor applications.
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Etch
Ion beam etch for precise control
of etch depth and excellent
surface properties.
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Optical & Stylus
High-speed optical profilers, interferometers, and stylus profilers
for production and research.
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Ion Sources
The widest range of ion sources and controllers for a broad range of coating and etch applications.
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MBE
Molecular beam epitaxy components, research systems, and production systems for compound semiconductors.
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MOCVD
Metal Organic Chemical Vapor Deposition
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Lapping
Lapping Systems for next generation lapping requirements for GMR, TMR andPMR heads.
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Slicing and Dicing
Slicing and dicing systemns deliver enabling technology for hard drive reliability.
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